Edition 2027

NEPCON JAPAN - Osaka 2027

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RX Japan
info@reedexpo.co.jp
Date of the event
12 May 2027 14 May 2027
Intex Osaka
1-chōme-5-102 Nankōkita, Suminoe Ward, Osaka, Japan
Frequency
Annual

About the Event

Description

ELECTROTEST JAPAN is Asia's leading exhibition specializing in test, inspection, measurement, and analysis for electronics manufacturing and R&D. As a key component of NEPCON JAPAN, it serves as a premier venue for professionals involved in electronics development and production. The event showcases the latest technologies in X-ray inspection, visual inspection, and environmental testing, facilitating business discussions and technical exchanges among industry leaders and engineers from across the globe.

Exhibits

In-circuit testers, AOI and AXI equipment, 3D inspection systems, environmental testing chambers, and semiconductor testing tools.

Activities

Technical conferences, business matching sessions, networking events, and specialized seminars on electronics quality control.

Speakers

Industry experts from leading electronics manufacturers, research institutions, and technology providers discussing smart factory trends.

Demos

Live demonstrations of high-speed automated optical inspection systems and precision measurement instruments on the show floor.

Accessibility

From Narita Airport, take the Keisei Skyliner to Nippori then transfer to the JR Keiyo Line for Makuhari Messe. From Haneda Airport, take the Airport Limousine Bus directly to Makuhari Messe.

Exhibitor Count

1700

Expected Attendance

75000

Ticket

Standard
Free / person
  • General admission for trade professionals with pre-registration.
On-site
¥5000 / person
  • Admission for those who do not pre-register.

Location

Visitor Reviews

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