Edition 2026

FINE PROCESS TECHNOLOGY EXPO JAPAN - NAGOYA 2026

179 vues
RX Japan
info@reedexpo.co.jp
Date of the event
25 Nov 2026 27 Nov 2026
Aichi Sky Expo
5-chōme-10番1号 Centrair, Tokoname, Japan
Frequency
Annual

About the Event

Description

FINE PROCESS TECHNOLOGY EXPO is a specialized international exhibition focused on high-precision processing technologies essential for electronics manufacturing. Part of the renowned NEPCON JAPAN series, the event showcases cutting-edge solutions in molding, cutting, press work, etching, and ultra-precision machining. It serves as a vital platform for engineers and manufacturers to discover advanced hardware and technical innovations that drive the miniaturization and high-performance capabilities of modern electronic devices.

Exhibits

Precision molding, laser cutting, etching, press work, ultra-precision machining, and fine surface treatment technologies for electronics.

Activities

Technical seminars on manufacturing trends, business matching sessions, and networking events for electronics industry professionals.

Speakers

Industry leaders from top electronics manufacturers and technical researchers discussing the future of high-precision processing.

Demos

Live demonstrations of high-speed laser processing, micro-molding machinery, and automated precision inspection systems.

Accessibility

The event is typically held at Makuhari Messe. From Narita Airport, take the Keisei Bus to Makuhari Messe (40 mins). From Haneda Airport, take the Airport Limousine Bus (50 mins). By train, take the JR Keiyo Line to Kaihimmakuhari Station, followed by a 5-minute walk.

Exhibitor Count

1700

Expected Attendance

75000

Ticket

Visitor Registration
Free / person
  • Standard entry for industry professionals with a valid business card or pre-registration code.
VIP Registration
Free / person
  • Exclusive entry for executives and decision-makers, providing access to the VIP lounge and keynote sessions.

Location

Visitor Reviews

You must be logged in to comment on this event.

No comment related to this event