Edition 2026

ELECTROTEST JAPAN - OSAKA 2026

181 vues

Past edition

RX Japan
info@reedexpo.co.jp
Date of the event
13 May 2026 15 May 2026
Intex Osaka
1-chōme-5-102 Nankōkita, Suminoe Ward, Osaka, Japan
Frequency
Annual

About the Event

Description

ELECTROTEST JAPAN is Asia's leading exhibition specializing in test, inspection, measurement, and analysis for electronics manufacturing and R&D. Held as part of the prestigious NEPCON JAPAN, it serves as a critical hub for electronics professionals to discover cutting-edge technologies in reliability testing and quality control. The event showcases a comprehensive range of equipment and services essential for the development and production of high-performance electronic devices, attracting engineers and manufacturers from across the globe.

Exhibits

Automated X-ray inspection, AOI, 3D measurement, ICT, flying probe testers, environmental chambers, and failure analysis tools for electronics.

Activities

Technical conferences, networking sessions, product demonstrations, and industry-specific seminars focusing on manufacturing quality.

Speakers

Industry experts from leading electronics manufacturers, semiconductor companies, and academic researchers in quality assurance.

Demos

Live demonstrations of high-speed inspection systems, non-destructive testing equipment, and advanced measurement software.

Accessibility

Located at Makuhari Messe in Chiba. From Narita Airport, take the Keisei Bus for 40 minutes. From Haneda Airport, take the Limousine Bus for 50 minutes. By train, take the JR Keiyo Line to Kaihimmakuhari Station.

Exhibitor Count

1700

Expected Attendance

85000

Location

Visitor Reviews

You must be logged in to comment on this event.

No comment related to this event